Built on a highly modular architecture, the manual testing platform prioritizes flexibility and scalability. It provides a practical starting point for precise metalens characterization that is designed to grow alongside your lab's evolving testing requirements.
Upgradeable with different modules and as a whole to auto-production or wafer-level tester
Module types are plug and play and shared between tester variants
Table-top system for normal lab environment
Software control via GUI or expert control of all components via programming API
Direct characterization of metalenses and metasurface performance by measuring:
Direct characterization of metalens and metasurface performance in VIS configuration:
The manual tester is available in three primary base configurations, each optimized for specific wavelength ranges and detector requirements. While sharing the same core modular hardware, each version is tailored to support distinct measurement applications across the visible, near-infrared, and short-wave infrared spectrums.
Designed for the characterization of metalenses and metasurfaces across the visible spectrum, where color performance, focusing quality, and imaging contrast are critical.
Covers the silicon-sensor-compatible near-infrared range. Optimized for active illumination, biometrics, and compact sensing systems.
Extends testing into the short-wave infrared (SWIR) range for applications where InGaAs, Ge, or other SWIR detectors are required.
Fiber-coupled, TEC-stabilized sources delivered to the illumination module via a single fiber output. Available variants:
Conditions the beam that reaches the sample. Common kinematic interface — any of the following drops into the same slot:
One general-purpose holder covers most prototyping needs; customized inserts handle the rest:
Up to four independent stations populated around the objective. Available modules:
| Specification | VIS | NIR-I | NIR-II |
|---|---|---|---|
| Wavelength range | 400-700 nm | 700-1100 nm | 1100 – 1600 nm |
| Source options | Single LD, Switchable Multi-LD, Broadband + Filter | ||
| Total magnification | 10x-150x | ||
| Supported focal lengths | Up to 20 mm | ||
| Angle of incidence | Up to 60° | ||
| Typical Z-step | 10 nm closed-loop piezo; 0.1 µm typical step in MTF / z-scan workflows | ||
| Maximum collected NA | 0.95 | ||
| Maximum sample size | Up To 1 In, With Custom Inserts | ||
| Upgradeable measurement stations | Up To 4 | ||
Configurations / enhancements outside these ranges can be discussed on request.
The Metalens Manual Tester platform serves as an entry point for companies and universities in the prototyping phase. As testing requirements scale, any manual tester configuration can be directly upgraded into a production auto-tester, and the same module library extends to our upcoming wafer-level platform.
Connect with us
Singapore (HQ)
Metaoptics Technologies Pte Ltd. 81 Ayer Rajah Crescent, #01-45 Singapore 139967
United States
Metaoptics Inc. 1 Ferry Building, Suite 201 San Francisco, CA 94111